共 21 条
[2]
BRANDT W, 1972, P INT C INN SHELL IO, V2, P948
[6]
SENSITIVITY VERSUS TARGET BACKINGS FOR ELEMENTAL ANALYSIS BY ALPHA EXCITED X-RAY-EMISSION
[J].
NUCLEAR INSTRUMENTS & METHODS,
1972, 100 (03)
:397-+
[7]
PROTON-INDUCED X-RAY-EMISSION AS A TOOL FOR TRACE-ELEMENT ANALYSIS
[J].
NUCLEAR INSTRUMENTS & METHODS,
1974, 116 (03)
:487-499
[9]
X-RAY ANALYSIS - ELEMENTAL TRACE ANALYSIS AT 10-12G LEVEL
[J].
NUCLEAR INSTRUMENTS & METHODS,
1970, 84 (01)
:141-+
[10]
JUNDT FC, 1972, P C INNER SHELL IONI, V2, P1450