CHARACTERIZATION OF SAPPHIRE SURFACES BY ELECTRON ENERGY-LOSS SPECTROSCOPY

被引:85
作者
GILLET, E
EALET, B
机构
[1] Laboratoire de Microscopic and Diffractions Electroniques, CNRS-URA, 13397 MarseilleCedex 13
关键词
D O I
10.1016/0039-6028(92)90079-L
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
By combining four surface analysis methods, AES, LEED, EELS and XPS, the stoichiometry and the crystallographic structure of alpha-Al2O3 surfaces can be related to specific band gap levels. A preparation process is described which permits one to obtain ordered alumina surfaces in two orientations, (0001) and (1012BAR). Thermal heating under ultrahigh vacuum induces stoichiometry changes. Equilibrium-reduced structures, characterized by LEED patterns and modifications in the band gap structure, are identified. It is shown that intrinsic surface states (ISS) are specific of clean stoichiometric surfaces. These levels, located at 5.7 and 4.1 eV below the conduction band minimum (CBm), are shifted and broadened on reduced surfaces decreasing the band gap value.
引用
收藏
页码:427 / 436
页数:10
相关论文
共 21 条
[1]  
ARGHIROPOULOS B, 1959, CRAS SCI 0911, P1895
[2]   IONICITY OF METALLIC OXIDE SURFACES ON METALS AS OBSERVED BY AUGER (XPS) SPECTROSCOPY [J].
ASCARELLI, P ;
MORETTI, G .
SURFACE AND INTERFACE ANALYSIS, 1985, 7 (01) :8-12
[3]   ELECTRONIC-STRUCTURE OF ALUMINUM-OXIDE AS DETERMINED BY X-RAY PHOTOEMISSION [J].
BALZAROTTI, A ;
BIANCONI, A .
PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 1976, 76 (02) :689-694
[4]   SILICON-ON-SAPPHIRE EPITAXY BY VACUUM SUBLIMATION - LEED-AUGER STUDIES AND ELECTRONIC PROPERTIES OF FILMS [J].
CHANG, CC .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1971, 8 (03) :500-&
[5]   X-RAY PHOTOELECTRON-SPECTROSCOPY STUDY OF CHEMICAL CHANGES IN OXIDE AND HYDROXIDE SURFACES INDUCED BY AR+ ION-BOMBARDMENT [J].
CHUANG, TJ ;
BRUNDLE, CR ;
WANDELT, K .
THIN SOLID FILMS, 1978, 53 (01) :19-27
[6]   ELECTRONIC-STRUCTURE OF ALPHA-ALUMINA AND ITS DEFECT STATES [J].
CIRACI, S ;
BATRA, IP .
PHYSICAL REVIEW B, 1983, 28 (02) :982-992
[7]   WORK FUNCTION MEASUREMENTS BY X-PE SPECTROSCOPY, AND THEIR RELEVANCE TO CALIBRATION OF X-PE SPECTRA [J].
EVANS, S .
CHEMICAL PHYSICS LETTERS, 1973, 23 (01) :134-138
[8]   COMPOSITION AND SURFACE STRUCTURE OF (0001) FACE OF ALPHA-ALUMINA BY LOW-ENERGY ELECTRON DIFFRACTION [J].
FRENCH, TM ;
SOMORJAI, GA .
JOURNAL OF PHYSICAL CHEMISTRY, 1970, 74 (12) :2489-&
[9]   MODIFICATIONS OF ALPHA-AL2O3(0001) SURFACES INDUCED BY THERMAL TREATMENTS OR ION-BOMBARDMENT [J].
GAUTIER, M ;
DURAUD, JP ;
VAN, LP ;
GUITTET, MJ .
SURFACE SCIENCE, 1991, 250 (1-3) :71-80
[10]   VALENCE-BAND AND CONDUCTION-BAND STRUCTURE OF THE SAPPHIRE (1102) SURFACE [J].
GIGNAC, WJ ;
WILLIAMS, RS ;
KOWALCZYK, SP .
PHYSICAL REVIEW B, 1985, 32 (02) :1237-1247