X-RAY AND ELLIPSOMETRIC STUDIES OF SELF-ASSEMBLED MONOLAYERS OF FLUORINATED CHLOROSILANES

被引：46

作者：

GEER, RE

STENGER, DA

CHEN, MS

CALVERT, JM

SHASHIDHAR, R

JEONG, YH

PERSHAN, PS

机构：

[1] USN,RES LAB,CTR BIOMOLEC SCI & ENGN,CODE 6900,WASHINGTON,DC 20375

[2] HARVARD UNIV,DEPT APPL SCI,CAMBRIDGE,MA 02138

[3] HARVARD UNIV,DEPT PHYS,CAMBRIDGE,MA 02138

来源：

LANGMUIR | 1994年 / 10卷 / 04期

关键词：

D O I：

10.1021/la00016a034

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Results of X-ray and ellipsometric studies on self-assembled monolayer films of three fluorinated chlorosilanes are presented. By inferring an index of refraction, the monolayer thicknesses obtained from both these types of studies are self-consistent. The tilt of the molecules with respect to the layer normal is found to be strongly dependent on the functionality of (i.e. the number of chlorine atoms attached to) the terminal Si atom of the molecule.

引用

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页码：1171 / 1176

页数：6

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