Semi-automatic atomic force microscope for imaging in solution

A semiautomatic atomic force microscope for imaging in solution is described. With this new design, the laser beam is focused into a fine line, and a rotating mirror is used to deflect the optical signal onto a fixed photodetector. The alignment is now operated with stepper motors. Combined with a three stepper motor sequential advancement for tip engagement, the operation of the atomic force microscope for imaging in solution is much simplified, and the crashing of the tip is largely avoided. Since all controls are now coupled with stepper motors, this system is fully compatible with automation and operation in a self sealed temperature controlled chamber. The design and the construction of this system is relatively simple and can be fitted into any existing system. (C) 1995 American Institute of Physics.