CARBON AS A SAMPLE SUBSTRATE IN SECONDARY ION MASS-SPECTROMETRY

被引：23

作者：

ROSS, MM ^{[1
]}

COLTON, RJ ^{[1
]}

机构：

[1] USN,RES LAB,DIV CHEM,WASHINGTON,DC 20375

来源：

ANALYTICAL CHEMISTRY | 1983年 / 55卷 / 01期

关键词：

D O I：

10.1021/ac00252a041

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：150 / 153

页数：4

共 14 条

[1] BASE PEAK PROFILES OF GAS CHROMATOGRAPHY-MASS SPECTROMETRIC DATA OBTAINED FROM THERMAL-DESORPTION OF ACTIVATED CARBONS [J].

ALBEN, K .

ANALYTICAL CHEMISTRY, 1980, 52 (12) :1821-1824

[2]

BARBER M, 1982, ANAL CHEM, V54, pA645

[3] HIGH-PERFORMANCE SECONDARY ION MASS-SPECTROMETER [J].

COLTON, RJ ;

CAMPANA, JE ;

BARLAK, TM ;

DECORPO, JJ ;

WYATT, JR .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1980, 51 (12) :1685-1689

[4] MOLECULAR SECONDARY ION MASS-SPECTROMETRY (SIMS) [J].

COLTON, RJ .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 18 (03) :737-747

[5] MOLECULAR SECONDARY ION MASS-SPECTROMETRY [J].

DAY, RJ ;

UNGER, SE ;

COOKS, RG .

ANALYTICAL CHEMISTRY, 1980, 52 (04) :A557-&

[6]

DEITZ VR, 1975, ACS S SER, V17

[7] SECONDARY ION MASS-SPECTROMETRY - CATIONIZATION OF ORGANIC-MOLECULES WITH METALS [J].

GRADE, H ;

COOKS, RG .

JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1978, 100 (18) :5615-5621

[8]

Kiselev A. V., 1969, GAS ADSORPTION CHROM

[9]

LEWIN G, 1965, FUNDAMENTALS VACUUM, P43

[10]

LIN LK, 1981, ANAL CHEM, V53, P109

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