X-RAY-DIFFRACTION STUDY OF INTENTIONALLY DISORDERED GAALAS-GAAS SUPERLATTICES

被引：28

作者：

AUVRAY, P

BAUDET, M

REGRENY, A

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1987年 / 62卷 / 02期

关键词：

D O I：

10.1063/1.339821

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：456 / 460

页数：5

共 14 条

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[10] SOME ASPECTS OF THE X-RAY STRUCTURAL CHARACTERIZATION OF (GA1-XALXAS)N1(GAAS)N2 GAAS(001) SUPERLATTICES [J].

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JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1984, 17 (JUN) :196-205

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