SOME ASPECTS OF THE X-RAY STRUCTURAL CHARACTERIZATION OF (GA1-XALXAS)N1(GAAS)N2 GAAS(001) SUPERLATTICES

被引：70

作者：

KERVAREC, J

BAUDET, M

CAULET, J

AUVRAY, P

EMERY, JY

REGRENY, A

机构：

[1] Cent Natl d'Etudes des, Telecommunications, Dep, Materiaux-Physique-Analyse, Lannion,, Cent Natl d'Etudes des Telecommunications, Dep Materiaux-Physique-Analyse, Lannion, Fr

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1984年 / 17卷 / JUN期

关键词：

D O I：

10.1107/S0021889884011286

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：196 / 205

页数：10

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