ANALYSIS OF DATA FROM AN OPTICAL ATOM-PROBE

被引：3

作者：

COOPER, AS ^{[1
]}

CEREZO, A ^{[1
]}

HYDE, JM ^{[1
]}

MACKENZIE, RAD ^{[1
]}

SMITH, GDW ^{[1
]}

机构：

[1] UNIV OXFORD,DEPT MAT,OXFORD OX1 3PH,ENGLAND

来源：

APPLIED SURFACE SCIENCE | 1994年 / 76卷 / 1-4期

关键词：

Microscopic examination;

D O I：

10.1016/0169-4332(94)90374-3

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

An algorithm has been developed for analysing image data from the optical atom probe (OAP) in order to calculate the positions of impact for multiple ions evaporated on a single pulse. This has been used to study the spatial separation of ion pairs generated on the same evaporation pulse. The form of the intensity distribution due to ion impacts has been analysed and compared with a simple model of electron emission from a channel plate. A method of correctly assigning flight times and positions within multi-ion frames is suggested, based on the correlation between the electrical and optical signals from the channel-plate detector.

引用

页码：409 / 415

页数：7

共 5 条

[1]

ANGER HO, 1965, Patent No. 3209201

[2] APPLICATION OF A POSITION-SENSITIVE DETECTOR TO ATOM PROBE MICROANALYSIS [J].