CHEMICAL ETCHING OF BERLINITE IN SULFURIC-ACID-SOLUTIONS

被引:5
作者
CAMBON, O
GOIFFON, A
PHILIPPOT, E
机构
[1] USTL Laboratoire de Physicochimie des matériaux, Montpellier Cedex, 34060, URA D 0407, Place Eugène Bataillon
关键词
D O I
10.1007/BF00588326
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The aim of this work is to chemically etch AT wafers of berlinite AlPO4 in sulphuric acid solutions in order to reach a thickness previously chosen (manufacturing of high frequency plate resonators). The kinetics of etching is studied: the decrease of thickness is followed by frequency measurement. The influence of temperature and acid concentration is measured and the evolution of surface texture is checked both by roughness measurements, resonance frequency and scanning electron microscopy methods.
引用
收藏
页码:846 / 851
页数:6
相关论文
共 23 条
[1]  
Bernot A. J., 1985, Proceedings of the 39th Annual Frequency Control Symposium 1985 (Cat. No.85CH2186-5), P271
[2]  
Brandmayr R.J., 1985, 39TH P ANN S FREQ CO, P276
[3]  
BRANDMAYR RJ, 1986, 40 ANN FREQ CONTR S, P86
[4]   ETCHING STUDIES ON QUARTZ SURFACES [J].
BRAUER, K ;
MULLER, E .
CRYSTAL RESEARCH AND TECHNOLOGY, 1984, 19 (11) :K101-K104
[5]  
BRICE JC, 1981, 35 ANN FREQ CONTR S, P312
[6]  
CADY WG, 1964, PIEZOELECTRICITY, V1, P106
[7]  
Dowsett J., 1985, Proceedings of the 39th Annual Frequency Control Symposium 1985 (Cat. No.85CH2186-5), P301
[8]  
GOIFFON A, 1987, REV CHIM MINER, V24, P593
[9]  
Hunt J. R., 1985, Proceedings of the 39th Annual Frequency Control Symposium 1985 (Cat. No.85CH2186-5), P292
[10]  
HUNT JR, 1987, 41 ANN FREQ CONTR S, P183