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COMMENT ON MICROWAVE MEASUREMENT OF CONDUCTIVITY + DIELECTRIC CONSTANT OF SEMICONDUCTORS

被引：4
作者：
CHAMPLIN, KS
NAG, BR
机构：
来源：
PROCEEDINGS OF THE IEEE | 1964年 / 52卷 / 09期
关键词：
D O I：
10.1109/PROC.1964.3259
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：1061 / &
相关论文
共 8 条
[1]   MICROWAVE TECHNIQUES IN STUDY OF SEMICONDUCTORS [J].
BHAR, JN .
PROCEEDINGS OF THE IEEE, 1963, 51 (11) :1623-&
[2]  
CHAMPLIN KS, 1962, P IRE, V50, P252
[3]  
CHAMPLIN KS, 1962, 1962 GBMTT NATL S BO
[4]  
COLLIN RE, 1960, FIELD THEORY GUIDED, pCH6
[5]   MICROWAVE MEASUREMENT OF COMPLEX PERMITTIVITY OF SEMICONDUCTORS [J].
GUNN, MW .
PROCEEDINGS OF THE IEEE, 1964, 52 (02) :185-&
[6]   MICROWAVE MEASUREMENT OF CONDUCTIVITY + DIELECTRIC CONSTANT OF SEMICONDUCTORS [J].
HOLMES, DA ;
FEUCHT, DL .
PROCEEDINGS OF THE IEEE, 1964, 52 (01) :100-&
[7]   CORRECTION TO MICROWAVE MEASUREMENT OF CONDUCTIVITY + DIELECTRIC CONSTANT OF SEMICONDUCTORS [J].
NAG, BR ;
CHATTERJI, CK ;
ROY, SK .
PROCEEDINGS OF THE IEEE, 1964, 52 (02) :185-+
[8]   MICROWAVE MEASUREMENT OF CONDUCTIVITY AND DIELECTRIC CONSTANT OF SEMICONDUCTORS [J].
NAG, BR ;
CHATTERJI, CK ;
ROY, SK .
PROCEEDINGS OF THE IEEE, 1963, 51 (06) :962-+
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