INELASTIC-COLLISIONS OF KV ELECTRONS IN SOLIDS

[41] AUGER ELECTRON SPECTROSCOPY OF FCC METAL SURFACES [J]. JOURNAL OF APPLIED PHYSICS, 1968, 39 (05) : 2425 - &

[42] PENN DR, 1987, PHYS REV B, V35, P842

[43] ELECTRONIC-STRUCTURE OF AMORPHOUS SI FROM PHOTOEMISSION AND OPTICAL STUDIES [J]. PHYSICAL REVIEW B, 1972, 5 (08): : 3017 - &

[44] HOT-ELECTRON SCATTERING LENGTH BY MEASUREMENT OF SPIN POLARIZATION [J]. PHYSICAL REVIEW B, 1974, 9 (10): : 4035 - 4037

[45] Pines D., 1964, ELEMENTARY EXCITATIO

[46] POWELL CJ, 1984, ELECTRON BEAM INTERA

[47] RANGE OF EXCITED ELECTRONS IN METALS [J]. PHYSICAL REVIEW, 1962, 1 (04): : 1453 - +

[48] RAETHER H, 1980, EXCITATION PLASMONS, pCH7

[49] IMAGING AND RECORDING OF MULTIPLE-SCATTERING EFFECTS BY ANGULAR-RESOLVED ELECTRON ENERGY-LOSS SPECTROSCOPY [J]. ULTRAMICROSCOPY, 1989, 28 (1-4) : 258 - 265

[50] AUGER SPECTRA AND LEED PATTERNS FROM NICKEL DEPOSITS ON CLEAVED SILICON [J]. SURFACE SCIENCE, 1971, 26 (02) : 683 - &

[41] AUGER ELECTRON SPECTROSCOPY OF FCC METAL SURFACES [J]. JOURNAL OF APPLIED PHYSICS, 1968, 39 (05) : 2425 - &

[42] PENN DR, 1987, PHYS REV B, V35, P842

[43] ELECTRONIC-STRUCTURE OF AMORPHOUS SI FROM PHOTOEMISSION AND OPTICAL STUDIES [J]. PHYSICAL REVIEW B, 1972, 5 (08): : 3017 - &

[44] HOT-ELECTRON SCATTERING LENGTH BY MEASUREMENT OF SPIN POLARIZATION [J]. PHYSICAL REVIEW B, 1974, 9 (10): : 4035 - 4037

[45] Pines D., 1964, ELEMENTARY EXCITATIO

[46] POWELL CJ, 1984, ELECTRON BEAM INTERA

[47] RANGE OF EXCITED ELECTRONS IN METALS [J]. PHYSICAL REVIEW, 1962, 1 (04): : 1453 - +

[48] RAETHER H, 1980, EXCITATION PLASMONS, pCH7

[49] IMAGING AND RECORDING OF MULTIPLE-SCATTERING EFFECTS BY ANGULAR-RESOLVED ELECTRON ENERGY-LOSS SPECTROSCOPY [J]. ULTRAMICROSCOPY, 1989, 28 (1-4) : 258 - 265

[50] AUGER SPECTRA AND LEED PATTERNS FROM NICKEL DEPOSITS ON CLEAVED SILICON [J]. SURFACE SCIENCE, 1971, 26 (02) : 683 - &