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A MODEL FOR THE SUBMICROMETER N-CHANNEL DEEP-DEPLETION SOS-MOSFET
被引:5
作者
:
JERDONEK, RT
论文数:
0
引用数:
0
h-index:
0
机构:
US DEPT DEF,FT MEAD,MD
US DEPT DEF,FT MEAD,MD
JERDONEK, RT
[
1
]
BANDY, WR
论文数:
0
引用数:
0
h-index:
0
机构:
US DEPT DEF,FT MEAD,MD
US DEPT DEF,FT MEAD,MD
BANDY, WR
[
1
]
BIRNBAUM, J
论文数:
0
引用数:
0
h-index:
0
机构:
US DEPT DEF,FT MEAD,MD
US DEPT DEF,FT MEAD,MD
BIRNBAUM, J
[
1
]
机构
:
[1]
US DEPT DEF,FT MEAD,MD
来源
:
IEEE TRANSACTIONS ON ELECTRON DEVICES
|
1980年
/ 27卷
/ 08期
关键词
:
D O I
:
10.1109/T-ED.1980.20071
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:1566 / 1570
页数:5
相关论文
共 13 条
[11]
SZE SM, 1969, PHYSICS SEMICONDUCTO, P61
[12]
VLSI LIMITATIONS FROM DRAIN-INDUCED BARRIER LOWERING
[J].
TROUTMAN, RR
论文数:
0
引用数:
0
h-index:
0
机构:
IBM General Technology Division, Essex Junction
TROUTMAN, RR
.
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1979,
14
(02)
:383
-391
[13]
THEORY OF CARRIER MULTIPLICATION AND NOISE IN AVALANCHE DEVICES .1. ONE-CARRIER PROCESSES
[J].
VANVLIET, KM
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical Engineering, University of Florida, Gainesville
VANVLIET, KM
;
RUCKER, LM
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical Engineering, University of Florida, Gainesville
RUCKER, LM
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1979,
26
(05)
:746
-751
←
1
2
→
共 13 条
[11]
SZE SM, 1969, PHYSICS SEMICONDUCTO, P61
[12]
VLSI LIMITATIONS FROM DRAIN-INDUCED BARRIER LOWERING
[J].
TROUTMAN, RR
论文数:
0
引用数:
0
h-index:
0
机构:
IBM General Technology Division, Essex Junction
TROUTMAN, RR
.
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1979,
14
(02)
:383
-391
[13]
THEORY OF CARRIER MULTIPLICATION AND NOISE IN AVALANCHE DEVICES .1. ONE-CARRIER PROCESSES
[J].
VANVLIET, KM
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical Engineering, University of Florida, Gainesville
VANVLIET, KM
;
RUCKER, LM
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical Engineering, University of Florida, Gainesville
RUCKER, LM
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1979,
26
(05)
:746
-751
←
1
2
→