INFORMATION INFERRED FROM OBSERVATION OF SPECKLES

被引：19

作者：

MAY, M ^{[1
]}

机构：

[1] UNIV PARIS 06, INST OPT, F-75230 PARIS 05, FRANCE

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1977年 / 10卷 / 09期

关键词：

D O I：

10.1088/0022-3735/10/9/001

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：849 / 864

页数：16

共 46 条

[1] RECORDING OF IN-PLANE SURFACE DISPLACEMENT BY DOUBLE-EXPOSURE SPECKLE PHOTOGRAPHY [J].

ARCHBOLD, E ;

BURCH, JM ;

ENNOS, AE .

OPTICA ACTA, 1970, 17 (12) :883-&

[2] DISPLACEMENT MEASUREMENT FROM DOUBLE-EXPOSURE LASER PHOTOGRAPHS [J].

ARCHBOLD, E ;

ENNOS, AE .

OPTICA ACTA, 1972, 19 (04) :253-&

[3]

BIEDERMANN K, 1970, OPT ACTA, V17, P631, DOI 10.1080/713818342

[4] SCATTER FRINGES OF EQUAL THICKNESS [J].

BURCH, JM .

NATURE, 1953, 171 (4359) :889-890

[5] PRODUCTION OF MULTIPLE BEAM FRINGES FROM PHOTOGRAPHIC SCATTERERS [J].

BURCH, JM ;

TOKARSKI, JM .

OPTICA ACTA, 1968, 15 (02) :101-&

[6]

BUTTERS JN, 1971, J PHYS E, V4, P272

[7]

CHAULNES, 1755, MEM ACAD R SCI, P136

[8] USE OF A LASER-PRODUCED SPECKLE PATTERN TO DETERMINE SURFACE ROUGHNESS [J].

CRANE, RB .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1970, 60 (12) :1658-&

[9]

DEBRUS S, 1972, OPT COMMUN, V6, P15

[10]

DEBRUS S, 1971, OPT COMMUN, V4, P172

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