X-RAY DIFFRACTION BY A CRYSTAL CONTAINING A TRANSLATION FAULT

被引：25

作者：

BONSE, U

HART, M

机构：

[1] Physikalisches Institut, Universität Münster

[2] H. H. Wills Physics Laboratory, University of Bristol

来源：

PHYSICA STATUS SOLIDI | 1969年 / 33卷 / 01期

关键词：

D O I：

10.1002/pssb.19690330133

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

We consider the diffraction of X‐rays by a bicrystal consisting of a thick part and a thin part separated by a rigid body translation. Both parts have identical lattice parameters. This simple model and the plane‐wave diffraction theory developed herein describe very well the contrast and geometry of the fringes obtained in X‐ray diffraction topographs of some silicon crystals bombarded by monoenergetic ions. Copyright © 1969 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim

引用

页码：351 / &

共 7 条

[1] MOIRE PATTERNS OF ATOMIC PLANES OBTAINED BY X-RAY INTERFEROMETRY
BONSE, U
HART, M
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[2] X-RAY INVESTIGATION OF LATTICE DEFORMATIONS IN SILICON INDUCED THROUGH HIGH-ENERGY ION IMPLANTATION
BONSE, U
HART, M
SCHWUTTKE, GH
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[3] THEORIE DER AUSBREITUNG VON RONTGEN-WELLENFELDSTRAHLEN IM SCHWACH DEFORMIERTEN KRISTALLGITTER
BONSE, U
[J]. ZEITSCHRIFT FUR PHYSIK, 1964, 177 (04): : 385 - &
[4] AN X-RAY INTERFEROMETER
BONSE, U
HART, M
[J]. APPLIED PHYSICS LETTERS, 1965, 6 (08) : 155 - &
[5] INFLUENCE OF X-RAY POLARIZATION ON VISIBILITY OF PENDELLOSUNG FRINGES IN X-RAY DIFFRACTION TOPOGRAPHS
HART, M
LANG, AR
[J]. ACTA CRYSTALLOGRAPHICA, 1965, 19 : 73 - &
[6] James R., 1948, OPTICAL PRINCIPLES D
[7] VONLAUE M, 1960, RONTGENSTRAHLINTERFE

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