COUPLING OF CROSSED PLANAR MULTICONDUCTOR SYSTEMS

被引：18

作者：

VEIT, W

DIESTEL, H

PREGLA, R

机构：

[1] SIEMENS AG,W-8000 MUNICH 70,GERMANY

[2] FERNUNIVGESAMTHSCH HAGEN,W-5400 HAGEN,GERMANY

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1990年 / 38卷 / 03期

关键词：

D O I：

10.1109/22.45343

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Capacitive couplings between orthogonally crossed, galvanically separated transmission lines are analyzed using the “method of lines.” The static capacitances of typical stripline configurations are calculated. Charge density distributions occurring when two parallel striplines are crossed by a third are described. © 1990 IEEE

引用

页码：265 / 269

页数：5

共 5 条

[1]

DIESTEL H, 1987, AEU-ARCH ELEKTRON UB, V41, P169

[2]

PREGLA R, 1988, NUMERICAL TECHNIQUES

[3] CHARACTERIZATION OF STRIP LINE CROSSING BY TRANSVERSE RESONANCE ANALYSIS [J].