ELECTRON CHARACTERISTIC ENERGY LOSSES IN METALS AND COMPOUNDS

[1] WIDE-RANGE LOGARITHMIC RADIATION METER [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1952, 23 (06) : 301 - 304

[2] GSCHLOSSL A, 1951, PHYS VERHAND, V4, P68

[3] ALUMINUM OXIDE REPLICAS FOR ELECTRON MICROSCOPY PRODUCED BY A 2-STEP PROCESS [J]. JOURNAL OF APPLIED PHYSICS, 1950, 21 (05) : 435 - 436

[4] EFFECT OF CHEMICAL COMBINATION ON THE CHARACTERISTIC ENERGY LOSS OF ELECTRONS [J]. PHYSICAL REVIEW, 1954, 95 (05): : 1345 - 1346

[5] LIPPERT W, 1955, OPTIK, V12, P467

[6] MARTON, 1955, ADV ELECTRONICS ELEC, V7, P185

[7] AUTOMATIC INSTRUMENT FOR ELECTRON SCATTERING MEASUREMENTS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1955, 26 (09) : 855 - 858

[8] MOLLENSTEDT G, 1952, OPTIK, V9, P473

[9] Rudberg E, 1936, PHYS REV, V50, P138, DOI 10.1103/PhysRev.50.138

[10] RUTHEMANN G, 1948, ANN PHYS-BERLIN, V2, P113

[1] WIDE-RANGE LOGARITHMIC RADIATION METER [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1952, 23 (06) : 301 - 304

[2] GSCHLOSSL A, 1951, PHYS VERHAND, V4, P68

[3] ALUMINUM OXIDE REPLICAS FOR ELECTRON MICROSCOPY PRODUCED BY A 2-STEP PROCESS [J]. JOURNAL OF APPLIED PHYSICS, 1950, 21 (05) : 435 - 436

[4] EFFECT OF CHEMICAL COMBINATION ON THE CHARACTERISTIC ENERGY LOSS OF ELECTRONS [J]. PHYSICAL REVIEW, 1954, 95 (05): : 1345 - 1346

[5] LIPPERT W, 1955, OPTIK, V12, P467

[6] MARTON, 1955, ADV ELECTRONICS ELEC, V7, P185

[7] AUTOMATIC INSTRUMENT FOR ELECTRON SCATTERING MEASUREMENTS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1955, 26 (09) : 855 - 858

[8] MOLLENSTEDT G, 1952, OPTIK, V9, P473

[9] Rudberg E, 1936, PHYS REV, V50, P138, DOI 10.1103/PhysRev.50.138

[10] RUTHEMANN G, 1948, ANN PHYS-BERLIN, V2, P113