ANALYTICAL ELECTRON-MICROSCOPIC STUDIES OF DOPED DICALCIUM SILICATES

被引：27

作者：

CHAN, CJ ^{[1
]}

KRIVEN, WM ^{[1
]}

YOUNG, JF ^{[1
]}

机构：

[1] ANACHEM CHEM LTD, MONTREAL, QUEBEC, CANADA

来源：

关键词：

D O I：

10.1111/j.1151-2916.1988.tb06403.x

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：713 / 719

页数：7

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