RHOMBOHEDRAL DISTORTION OF EUS EPITAXIAL-FILMS ON SI(111) SUBSTRATES

[1] [Anonymous], 1942, XRAY CRYSTALLOGRAPHY

[2] X-RAY MIRROR REFLECTIVITIES FROM 3.8 TO 50 KEV (3.3 TO 0.25 A) .2. PT, SI AND OTHER MATERIALS [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1982, 195 (1-2): : 91 - 95

[3] PRECISION LATTICE CONSTANT DETERMINATION [J]. ACTA CRYSTALLOGRAPHICA, 1960, 13 (10): : 814 - 818

[4] HAUCK J, 1986, UNPUB

[5] HERRES N, 1985, FORTSCHR MINERAL, V63, P95

[6] Kiessig H, 1931, ANN PHYS-BERLIN, V10, P769

[7] MANTL S, 1986, MATERIALS RES SOC S, V56, P195

[8] MOLECULAR-BEAM EPITAXY AND MAGNETIC-PROPERTIES OF EUS FILMS ON SILICON [J]. JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 1982, 28 (03) : 305 - 312

[1] [Anonymous], 1942, XRAY CRYSTALLOGRAPHY

[2] X-RAY MIRROR REFLECTIVITIES FROM 3.8 TO 50 KEV (3.3 TO 0.25 A) .2. PT, SI AND OTHER MATERIALS [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1982, 195 (1-2): : 91 - 95

[3] PRECISION LATTICE CONSTANT DETERMINATION [J]. ACTA CRYSTALLOGRAPHICA, 1960, 13 (10): : 814 - 818

[4] HAUCK J, 1986, UNPUB

[5] HERRES N, 1985, FORTSCHR MINERAL, V63, P95

[6] Kiessig H, 1931, ANN PHYS-BERLIN, V10, P769

[7] MANTL S, 1986, MATERIALS RES SOC S, V56, P195

[8] MOLECULAR-BEAM EPITAXY AND MAGNETIC-PROPERTIES OF EUS FILMS ON SILICON [J]. JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 1982, 28 (03) : 305 - 312