VACANCY IN SILICON - HYPERFINE INTERACTIONS FROM ELECTRON-NUCLEAR DOUBLE-RESONANCE MEASUREMENTS

被引:49
作者
SPRENGER, M [1 ]
MULLER, SH [1 ]
SIEVERTS, EG [1 ]
AMMERLAAN, CAJ [1 ]
机构
[1] UNIV AMSTERDAM,NAT KUNDIG LAB,1018 XE AMSTERDAM,NETHERLANDS
来源
PHYSICAL REVIEW B | 1987年 / 35卷 / 04期
关键词
D O I
10.1103/PhysRevB.35.1566
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:1566 / 1581
页数:16
相关论文
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