CdS quantum dots were prepared in glass films obtained from tetramethoxysilane (TMOS) or from tetraethoxysilane (TEOS) of typical thickness of 0.1-0.2-mu-m. Diameters of the particles were evaluated from X-ray diffraction and from transmission electron microscopy and correlated with inflection points on the absorption spectra. The lowest quantum states are estimated and nonlinear optical properties measured.