KERR ELECTRO-OPTIC FIELD-MAPPING MEASUREMENTS IN ELECTRON-BEAM IRRADIATED POLYMETHYLMETHACRYLATE

被引：39

作者：

HIKITA, M ^{[1
]}

ZAHN, M ^{[1
]}

WRIGHT, KA ^{[1
]}

COOKE, CM ^{[1
]}

BRENNAN, J ^{[1
]}

机构：

[1] MIT,DEPT ELECT ENGN & COMP SCI,ELECTROMAGNET & ELECTR SYST LAB,HIGH VOLTAGE RES LAB,CAMBRIDGE,MA 02139

来源：

IEEE TRANSACTIONS ON ELECTRICAL INSULATION | 1988年 / 23卷 / 05期

关键词：

HIS work was supported by Computer Sciences Cor-T poration; Albuquerque; NM; by a consortium of electric utility organizations as part of the M.I.T. Electric U tilities Program; by the National Science Foundation under Grant No.ECS-8517075; and by the Air Force Office of Scientific Research;

D O I：

10.1109/14.8750

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：861 / 880

页数：20

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