THE EFFECTS OF SURFACE-ROUGHNESS CHARACTERIZED BY FRACTAL GEOMETRY ON SPUTTERING

被引:101
作者
RUZIC, DN
机构
[1] Department of Nuclear Engineering, University of Illinois, Urbana, IL 61801
基金
美国国家科学基金会;
关键词
D O I
10.1016/0168-583X(90)90019-Q
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Fractal geometry has been added to the binary-collision TRIM computer code to simulate realistic atomic-scale surface roughness. This inclusion significantly affects TRIM sputtering yields and reflection coefficients at low energies (10s to 100s of eV) and non-normal angles of incidence. Results are shown and favorably compared to experiments for H and C sputtering of C as a function of angle, energy and fractal dimension. Energy and angular distributions of the sputtered and reflected particles as a function of fractal dimension are also shown. © 1990.
引用
收藏
页码:118 / 125
页数:8
相关论文
共 18 条
[1]  
ANDERSEN HH, 1981, SPUTTERING PARTICLE, pCH4
[2]  
[Anonymous], 1973, SELECTED VALUES THER
[3]   CHEMISTRY IN NONINTEGER DIMENSIONS BETWEEN 2 AND 3 .2. FRACTAL SURFACES OF ADSORBENTS [J].
AVNIR, D ;
FARIN, D ;
PFEIFER, P .
JOURNAL OF CHEMICAL PHYSICS, 1983, 79 (07) :3566-3571
[4]   A MONTE-CARLO COMPUTER-PROGRAM FOR THE TRANSPORT OF ENERGETIC IONS IN AMORPHOUS TARGETS [J].
BIERSACK, JP ;
HAGGMARK, LG .
NUCLEAR INSTRUMENTS & METHODS, 1980, 174 (1-2) :257-269
[5]   SPUTTERING STUDIES WITH THE MONTE-CARLO PROGRAM TRIM.SP [J].
BIERSACK, JP ;
ECKSTEIN, W .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1984, 34 (02) :73-94
[6]   EROSION REDEPOSITION MODELING AND CALCULATIONS FOR CARBON [J].
BROOKS, JN ;
BRICE, DK ;
DEWALD, AB ;
MCGRATH, RT .
JOURNAL OF NUCLEAR MATERIALS, 1989, 162 :363-368
[7]   Adsorption of gases in multimolecular layers [J].
Brunauer, S ;
Emmett, PH ;
Teller, E .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1938, 60 :309-319
[8]  
Cuomo J. J., 1989, HDB ION BEAM PROCESS
[9]   DATA SETS FOR HYDROGEN REFLECTION AND THEIR USE IN NEUTRAL TRANSPORT CALCULATIONS [J].
ECKSTEIN, W ;
HEIFETZ, DB .
JOURNAL OF NUCLEAR MATERIALS, 1987, 145 :332-338
[10]   SELF-SPUTTERING AND REFLECTION [J].
ECKSTEIN, W ;
BIERSACK, JP .
ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER, 1986, 63 (01) :109-120