PRINCIPLES AND PRACTICE OF WEAK-BEAM METHOD OF ELECTRON-MICROSCOPY

被引：100

作者：

COCKAYNE, DJ ^{[1
]}

机构：

[1] UNIV OXFORD, DEPT MET, PARKS RD, OXFORD, ENGLAND

来源：

JOURNAL OF MICROSCOPY | 1973年 / 98卷 / JUL期

关键词：

D O I：

10.1111/j.1365-2818.1973.tb03815.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：116 / 134

页数：19

共 43 条

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[3] WEAK BEAM OBSERVATION OF DISLOCATION LOOPS IN SILICON [J].

BICKNELL, RW .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1971, 7 (01) :K1-&

[4]

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[5] ELECTRON MICROSCOPE IMAGE CONTRAST FROM DISLOCATION LOOPS [J].

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MAHER, DM ;

PERRIN, RC .

PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1971, 43 (02) :689-&

[6]

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[7]

COCKAYNE DJ, 1972, Z NATURFORSCH PT A, VA 27, P452

[8] INVESTIGATIONS OF DISLOCATION STRAIN FIELDS USING WEAK BEAMS [J].

COCKAYNE, DJ ;

RAY, ILF ;

WHELAN, MJ .

PHILOSOPHICAL MAGAZINE, 1969, 20 (168) :1265-&

[9] MEASUREMENT OF STACKING-FAULT ENERGIES OF PURE FACE-CENTRED CUBIC METALS [J].

COCKAYNE, DJ ;

JENKINS, ML ;

RAY, ILF .

PHILOSOPHICAL MAGAZINE, 1971, 24 (192) :1383-&

[10]

COCKAYNE DJH, 1970, THESIS U OXFORD

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