G-R NOISE EXPERIMENTS IN DOUBLE-INJECTION SILICON DIODES OPERATING IN SEMICONDUCTOR REGIME

被引:7
作者
WORCH, PR
BILGER, HR
机构
来源
PHYSICA | 1970年 / 50卷 / 02期
关键词
D O I
10.1016/0031-8914(70)90001-7
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
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页码:161 / &
相关论文
共 8 条
[1]  
BARON R, SEMICONDUCTORS SEMIM, V8
[2]   GENERATION-RECOMBINATION NOISE IN DOUBLE-INJECTION DIODES [J].
BILGER, HR ;
WORCH, PR ;
LEE, LL ;
NICOLET, MA .
SOLID-STATE ELECTRONICS, 1969, 12 (11) :849-&
[3]   NOISE AND EQUIVALENT CIRCUIT OF DOUBLE INJECTION [J].
BILGER, HR ;
LEE, DH ;
NICOLET, MA ;
MCCARTER, ER .
JOURNAL OF APPLIED PHYSICS, 1968, 39 (13) :5913-&
[4]   G-R NOISE AND ADMITTANCE OF DOUBLE INJECTION DIODES [J].
DRIEDONKS, F .
PHYSICA, 1970, 46 (02) :291-+
[5]  
DRIEDONKS F, 1968, P C PHYSICAL ASPECTS
[6]   ON DOUBLE INJECTION CURRENT NOISE IN SOLIDS [J].
FAZAKAS, AB ;
FRIEDMAN, A .
PHYSICA STATUS SOLIDI, 1968, 28 (01) :385-&
[7]   2-CARRIER SPACE-CHARGE-LIMITED CURRENT IN A TRAP-FREE INSULATOR [J].
PARMENTER, RH ;
RUPPEL, W .
JOURNAL OF APPLIED PHYSICS, 1959, 30 (10) :1548-1558
[8]  
WORCH PR, 1970, THESIS OKLAHOMA STAT