A THRESHOLD PHOTOELECTRON-PHOTOION COINCIDENCE STUDY OF THE N2O+ DISSOCIATION BETWEEN 15 AND 20.5 EV

被引：91

作者：

NENNER, I ^{[1
]}

GUYON, PM ^{[1
]}

BAER, T ^{[1
]}

GOVERS, TR ^{[1
]}

机构：

[1] UNIV PARIS 11,LURE,CNRS LAB,F-91405 ORSAY,FRANCE

来源：

JOURNAL OF CHEMICAL PHYSICS | 1980年 / 72卷 / 12期

关键词：

D O I：

10.1063/1.439115

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Branching ratios and the kinetic energy released in the various fragmentation channels of energy selected N2O+ (15-20.5 eV) were investigated by the technique of threshold photoelectron-photoion coincidence. Pulsed synchrotron radiation from ACO, Orsay's storage ring, dispersed by a monochromator, was used as a photon source. Threshold electrons were energy selected on the basis of angular and temporal discrimination against energetic electrons. The energy region below 16.388 eV and the Ã state were investigated in detail. Below the Ã state, the most abundant fragment ion is O+, while above the Ã state NO+ dominates. Results for the B and C states are also reported. © 1980 American Institute of Physics.

引用

页码：6587 / 6592

页数：6

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