PRECISION OF ELLIPSOMETRIC MEASUREMENT

[1] ABELES F, 1963, PROGRESS OPTICS 2

[2] HEAVENS OS, 1964, PHYS THIN FILMS, V2, P193

[3] MEASUREMEMT OF THICKNESS AND REFRACTIVE INDEX OF VERY THIN FILMS AND OPTICAL PROPERTIES OF SURFACES BY ELLIPSOMETRY [J]. JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS SECTION A-PHYSICS AND CHEMISTRY, 1963, A 67 (04): : 363 - +

[4] Vasicek A., 1960, OPTICS THIN FILMS

[5] VASICEK A, 1957, MERENI VYTVARENI TEN

[6] WINTERBOTTOM AB, 1955, 1 ROY NORW SCI SOC R

[7] [No title captured]

[1] ABELES F, 1963, PROGRESS OPTICS 2

[2] HEAVENS OS, 1964, PHYS THIN FILMS, V2, P193

[3] MEASUREMEMT OF THICKNESS AND REFRACTIVE INDEX OF VERY THIN FILMS AND OPTICAL PROPERTIES OF SURFACES BY ELLIPSOMETRY [J]. JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS SECTION A-PHYSICS AND CHEMISTRY, 1963, A 67 (04): : 363 - +

[4] Vasicek A., 1960, OPTICS THIN FILMS

[5] VASICEK A, 1957, MERENI VYTVARENI TEN

[6] WINTERBOTTOM AB, 1955, 1 ROY NORW SCI SOC R

[7] [No title captured]