AN IMPROVED APPARATUS FOR MEASUREMENT OF AUGER ELECTRON SPECTRA

被引：16

作者：

GALLON, TE

HIGGINBOTHAM, IG

PRUTTON, M

机构：

[1] Physics Department, University of York, Heslington

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1969年 / 2卷 / 10期

关键词：

D O I：

10.1088/0022-3735/2/10/417

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

An apparatus to detect Auger electrons emitted from the surface of a sample in a low energy electron diffraction chamber is described. By employing a high impedance tuned load with a matching amplifier and a filter of high quality, Auger emission spectra of good stability have been obtained with a sensitivity close to the theoretical limit.

引用

页码：894 / +

页数：1

共 6 条

[1] ANALYSIS OF MATERIALS BY ELECTRON-EXCITED AUGER ELECTRONS [J].