GATED FIELD EMITTER FAILURES - EXPERIMENT AND THEORY

被引:16
作者
BROWNING, J [1 ]
MCGRUER, NE [1 ]
MEASSICK, S [1 ]
CHAN, C [1 ]
BINTZ, WJ [1 ]
GILMORE, M [1 ]
机构
[1] NORTHEASTERN UNIV,DEPT ELECT & COMP ENGN,BOSTON,MA 02115
关键词
D O I
10.1109/27.163587
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
Intrinsic failures of gated field emitters have been studied. The gate-emitter voltage drops from a typical value of 140 V to 10-70 V in less than 10 ns at the onset of a failure. Measurements with an electrostatic probe indicate that plumes of ions and electrons are ejected into vacuum. The measured ion current to the probe is typically 10% of the electron current. The voltage during the event and the ion-to-electron current ratio measured at the probe are characteristic of a cathodic vacuum arc plasma. For series resistors less than 1 kOMEGA, the arc is continuous while for series resistors greater than 10 kOMEGA, the the arc is intermittent. Initiation of the failure based on ion-space-charge enhancement of the emitter electric field is modeled with the plasma simulation code PDS1. These structures provide a controlled geometry for studying arcs of micron size dimension.
引用
收藏
页码:499 / 506
页数:8
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