COMPUTER GENERATION AND IDENTIFICATION OF KIKUCHI PROJECTIONS

被引：32

作者：

YOUNG, CT

LYTTON, JL

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1972年 / 43卷 / 04期

关键词：

D O I：

10.1063/1.1661333

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1408 / &

共 18 条

[1] DETERMINATION OF ORIENTATION OF MICRO-CRYSTALS USING A BACK-REFLECTION KOSSEL TECHNIQUE AND AN ELECTRON PROBE MICROANALYSER [J].

BEVIS, M ;

SWINDELLS, N .

PHYSICA STATUS SOLIDI, 1967, 20 (01) :197-+

[2] GENERATION AND APPLICATIONS OF COMPUTER DRAWN KIKUCHI MAPS [J].

BOMBACK, JL ;

THOMAS, LE .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1971, 4 (OCT1) :356-&

[3] KIKUCHI-LIKE REFLECTION PATTERNS OBTAINED WITH SCANNING ELECTRON MICROSCOPE [J].

COATES, DG .

PHILOSOPHICAL MAGAZINE, 1967, 16 (144) :1179-&

[4] HIGH-VOLTAGE TRANSMISSION SCANNING ELECTRON MICROSCOPY [J].

COWLEY, JM .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1970, 3 :49-&

[5] STRAIN + PRECISION LATTICE PARAMETER MEASUREMENTS BY X-RAY DIVERGENT BEAM METHOD .I. [J].

ELLIS, T ;

WEISSMANN, S ;

SHRIER, A ;

NANNI, LF ;

HOSOKAWA, N ;

PADAWER, GE .

JOURNAL OF APPLIED PHYSICS, 1964, 35 (11) :3364-&

[6] WIDTHS OF TRANSMISSION KIKUCHI LINES IN SILICON AND DIAMOND [J].

FOWLER, HA ;

MARTON, L .

JOURNAL OF APPLIED PHYSICS, 1965, 36 (06) :1986-&

[7]

FRAZER J, 1966, XRAY OPTICS MICROANA, P516

[8] EVALUATION OF KOSSEL MICRODIFFRACTION PROCEDURES - CUBIC CASE [J].

GIELEN, P ;

YAKOWITZ, H ;

GANOW, D ;

OGILVIE, RE .

JOURNAL OF APPLIED PHYSICS, 1965, 36 (3P1) :773-&

[9]

Heimendahl M., 1964, J APPL PHYS, V35, P3614

[10]

HIRSH PB, 1965, ELECTRON MICROSCOPY

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