AUGER, ELLIPSOMETRY, AND ENVIRONMENTAL-STUDIES OF THIN-FILMS APPLIED TO SCHOTTKY (MIS) SOLAR-CELLS

被引：9

作者：

KIM, JK

ANDERSON, WA

DELAHOY, AE

机构：

来源：

JOURNAL OF ELECTRONIC MATERIALS | 1978年 / 7卷 / 03期

关键词：

D O I：

10.1007/BF02655645

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：403 / 414

页数：12

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[1] 8 PERCENT EFFICIENT LAYERED SCHOTTKY-BARRIER SOLAR CELL
ANDERSON, WA
DELAHOY, AE
MILANO, RA
[J]. JOURNAL OF APPLIED PHYSICS, 1974, 45 (09) : 3913 - 3915
[2] FACTORS WHICH MAXIMIZE EFFICIENCY OF CR-P-SI SCHOTTKY (MIS) SOLAR-CELLS
ANDERSON, WA
VERNON, SM
DELAHOY, AE
KIM, JK
MATHE, P
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1976, 13 (06): : 1158 - 1161
[3] MINORITY-CARRIER MIS TUNNEL-DIODES AND THEIR APPLICATION TO ELECTRON-VOLTAIC AND PHOTO-VOLTAIC ENERGY-CONVERSION .1. THEORY
GREEN, MA
KING, FD
SHEWCHUN, J
[J]. SOLID-STATE ELECTRONICS, 1974, 17 (06) : 551 - 561
[4] OSCILLATIONS IN MOS TUNNELING
LEWICKI, G
MASERJIAN, J
[J]. JOURNAL OF APPLIED PHYSICS, 1975, 46 (07) : 3032 - 3039