BRIGHTNESS MEASUREMENTS OF NANOMETER-SIZED FIELD-EMISSION-ELECTRON SOURCES

被引：55

作者：

QIAN, W

SCHEINFEIN, MR

SPENCE, JCH

机构：

[1] Department of Physics and Astronomy, Arizona State University, Tempe

来源：

JOURNAL OF APPLIED PHYSICS | 1993年 / 73卷 / 11期

关键词：

D O I：

10.1063/1.352371

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The brightness of nanometer-sized field-emission-electron sources have been measured experimentally. Ultrasharp tungsten (111) single-crystal tips were fabricated in situ using Ne sputtering and field evaporation, and monitored using field ion microscopy. The average brightness of single-atom-terminated nanotips was found to be 3.3 X 10(8) A cm-2 sr-1 at 470 V, or 7.7 X 10(10) A cm-2 sr-1 when extrapolated to 100 kV. These results show an improvement of about two orders of magnitude in source brightness over existing cold field-emission-electron sources, and produce a beam with greater particle flux per unit energy than those obtainable using current synchrotron/wiggler/undulator devices.

引用

页码：7041 / 7045

页数：5

共 28 条

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