CHARGED-PARTICLE ACTIVATION METHODS FOR THE ANALYSIS OF CARBON AND OXYGEN IN HIGH-PURITY GALLIUM

被引:5
作者
BAKRAJI, EH
GIOVAGNOLI, A
BLONDIAUX, G
DEBRUN, JL
机构
[1] CNRS-CERI, 3A, rue de la Férollerie
关键词
D O I
10.1016/0168-583X(90)90332-O
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Methods for the instrumental analysis of C and O at trace level in high-purity gallium were developed. The 12C (d, n)13N and 16O(t, n)18F reactions were used between 2.5 and 3.5 MeV, allowing analyses down to tens of ppb/weight. The 16O(p, α)13N reaction at 15 MeV was also used; in this case 13N has to be separated radiochemically. © 1990.
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页码:65 / 67
页数:3
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