CONTRAST OF A STACKING-FAULT IN X-RAY SECTION TOPOGRAPHY - STUDY OF THE LAUE-BRAGG CASE

被引：12

作者：

EPELBOIN, Y ^{[1
]}

机构：

[1] IBM CORP,THOMAS J WATSON RES CTR,POB 250,YORKTOWN HTS,NY 10598

来源：

JOURNAL OF APPLIED PHYSICS | 1979年 / 50卷 / 03期

关键词：

D O I：

10.1063/1.326164

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have studied the contrast of a stacking fault in the Laue-Bragg case, i.e., when the wave fields incident from the defect are reflected from its surface and never propagate into the other part of the crystal. To calculate the contrast of such a defect we have computed the images by a direct integration of Takagi's equations. We show the influence of different parameters such as the geometry of the fault, the fault vector, and the photoelectric absorption. The results are very similar to those obtained by Authier in the Laue-Laue case and the contrast may be explained in a similar manner.

引用

页码：1312 / 1317

页数：6