STRUCTURAL DETERMINATION OF A W(001)C(2X2)-AG SURFACE BY X-RAY PHOTOELECTRON DIFFRACTION WITH MULTIPLE-SCATTERING ANALYSIS

被引:12
作者
CHEN, X [1 ]
ABUKAWA, T [1 ]
TANI, J [1 ]
KONO, S [1 ]
机构
[1] TOHOKU UNIV, INST FLUID SCI, SENDAI, MIYAGI 98077, JAPAN
关键词
D O I
10.1103/PhysRevB.52.12380
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We have studied x-ray photoelectron diffraction (XPD) for Ag 3d emission from the W(001)c(2X2)Ag surface with both full multiple-scattering cluster (MSG) and single-scattering cluster analyses. Quantitative structural parameters are obtained for the top layer of the Ag-W alloy structure. Systematic reliability factor searches based on MSC have shown that the outermost layer of the W(001)c(2X2)-Ag surface forms a rumpled Ag-W alloy structure, and the plane containing Ag atoms is 0.3 +/- 0.1 Angstrom higher than the tungsten top layer. It has also been found that, in this system, there is a strong multiple-scattering effect in the photoelectron diffraction even for a high kinetic energy of 1115 eV, where single-scattering theory was generally assumed to be valid. This indicates that, for high Z and closely packed systems, the kinematical method is not suitable for the quantitative analysis of XPD experiments.
引用
收藏
页码:12380 / 12385
页数:6
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