2-WAVELENGTH INTERFEROMETRY BY SUPERLUMINESCENT SOURCE FILTERING

A two-wavelength approach for high-resolution absolute interferometric measurement is presented where two sources are extracted from the same superluminescent emission by a couple of interference filters. The advantages in terms of resolution and precision of the novel method can be exploited in a wide class of either free-space or guided wave interferometers. An experiment of distance measurement is given and a resolution better than 1/1 000 mum is reached with an accuracy of 10(4). This method is able to match a wide range of sensing specifications with unique characteristics of simplicity and reliability.