MEASUREMENT TECHNIQUES IN MICROSTRIP

被引：127

作者：

TROUGHTON, P

机构：

[1] Department of Electronic & Electrical Engineering, University College London

来源：

ELECTRONICS LETTERS | 1969年 / 5卷 / 02期

关键词：

D O I：

10.1049/el:19690017

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A novel technique has been developed for measurement of dispersion and wavelength in microstrip transmission line laid down on an Al2O3 substrate. The frequency range so far investigated has been 4--12GHz, although the method could be satisfactorily used at far higher frequencies. The measurement accuracy is better than within 1 %. Techniques for producing well matched transitions to any thickness substrate have also been established. © 1969, The Institution of Electrical Engineers. All rights reserved.

引用

页码：25 / +

页数：1