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DETERMINATION OF DIFFUSION LENGTH AND SURFACE RECOMBINATION VELOCITY BY LIGHT EXCITATION
被引:29
作者
:
HU, C
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CALIF BERKELEY,ELECTR RES LAB,BERKELEY,CA 94720
UNIV CALIF BERKELEY,ELECTR RES LAB,BERKELEY,CA 94720
HU, C
[
1
]
DROWLEY, C
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV CALIF BERKELEY,ELECTR RES LAB,BERKELEY,CA 94720
UNIV CALIF BERKELEY,ELECTR RES LAB,BERKELEY,CA 94720
DROWLEY, C
[
1
]
机构
:
[1]
UNIV CALIF BERKELEY,ELECTR RES LAB,BERKELEY,CA 94720
来源
:
SOLID-STATE ELECTRONICS
|
1978年
/ 21卷
/ 07期
关键词
:
D O I
:
10.1016/0038-1101(78)90295-2
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:965 / 968
页数:4
相关论文
共 11 条
[1]
THEORY OF LIFE TIME MEASUREMENTS WITH SCANNING ELECTRON-MICROSCOPE - STEADY-STATE
BERZ, F
论文数:
0
引用数:
0
h-index:
0
机构:
MULLARD RES LABS,REDHILL,SURREY,ENGLAND
MULLARD RES LABS,REDHILL,SURREY,ENGLAND
BERZ, F
KUIKEN, HK
论文数:
0
引用数:
0
h-index:
0
机构:
MULLARD RES LABS,REDHILL,SURREY,ENGLAND
MULLARD RES LABS,REDHILL,SURREY,ENGLAND
KUIKEN, HK
[J].
SOLID-STATE ELECTRONICS,
1976,
19
(06)
: 437
-
445
[2]
CASEY HC, 1973, J APPL PHYS, V44, P5281
[3]
APPLICATION OF SCANNING ELECTRON-MICROSCOPY TO DETERMINATION OF SURFACE RECOMBINATION VELOCITY - GAAS
JASTRZEBSKI, L
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,DEPT ELECT ENGN & COMP,CAMBRIDGE,MA 02139
JASTRZEBSKI, L
LAGOWSKI, J
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,DEPT ELECT ENGN & COMP,CAMBRIDGE,MA 02139
LAGOWSKI, J
GATOS, HC
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,DEPT ELECT ENGN & COMP,CAMBRIDGE,MA 02139
GATOS, HC
[J].
APPLIED PHYSICS LETTERS,
1975,
27
(10)
: 537
-
539
[4]
LASER BEAMS AND RESONATORS
KOGELNIK, H
论文数:
0
引用数:
0
h-index:
0
KOGELNIK, H
LI, T
论文数:
0
引用数:
0
h-index:
0
LI, T
[J].
APPLIED OPTICS,
1966,
5
(10)
: 1550
-
+
[5]
LUKE YL, 1962, INTEGRALS BESSEL FUN, P248
[6]
SEKALA AM, 1975, I PHYS C SER, P245
[7]
USE OF SCHOTTKY-DIODE COLLECTORS FOR SEM DETERMINATION OF BULK DIFFUSION LENGTHS
VANOPDORP, C
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS, EINDHOVEN, NETHERLANDS
PHILIPS RES LABS, EINDHOVEN, NETHERLANDS
VANOPDORP, C
PETERS, RC
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS, EINDHOVEN, NETHERLANDS
PHILIPS RES LABS, EINDHOVEN, NETHERLANDS
PETERS, RC
KLERK, M
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS, EINDHOVEN, NETHERLANDS
PHILIPS RES LABS, EINDHOVEN, NETHERLANDS
KLERK, M
[J].
APPLIED PHYSICS LETTERS,
1974,
24
(03)
: 125
-
126
[8]
INJECTED CURRENT CARRIER TRANSPORT IN A SEMI-INFINITE SEMICONDUCTOR AND THE DETERMINATION OF LIFETIMES AND SURFACE RECOMBINATION VELOCITIES
VANROOSBROECK, W
论文数:
0
引用数:
0
h-index:
0
VANROOSBROECK, W
[J].
JOURNAL OF APPLIED PHYSICS,
1955,
26
(04)
: 380
-
391
[9]
DETERMINATION OF MINORITY-CARRIER LIFETIME AND SURFACE RECOMBINATION VELOCITY WITH HIGH SPACIAL RESOLUTION
WATANABE, M
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,DEPT MAT SCI & ENGN,CAMBRIDGE,MA 02139
MIT,DEPT MAT SCI & ENGN,CAMBRIDGE,MA 02139
WATANABE, M
ACTOR, G
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,DEPT MAT SCI & ENGN,CAMBRIDGE,MA 02139
MIT,DEPT MAT SCI & ENGN,CAMBRIDGE,MA 02139
ACTOR, G
GATOS, HC
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,DEPT MAT SCI & ENGN,CAMBRIDGE,MA 02139
MIT,DEPT MAT SCI & ENGN,CAMBRIDGE,MA 02139
GATOS, HC
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1977,
24
(09)
: 1172
-
1177
[10]
WATSON GN, 1944, TREATISE THEORY BESS, P417
←
1
2
→
共 11 条
[1]
THEORY OF LIFE TIME MEASUREMENTS WITH SCANNING ELECTRON-MICROSCOPE - STEADY-STATE
BERZ, F
论文数:
0
引用数:
0
h-index:
0
机构:
MULLARD RES LABS,REDHILL,SURREY,ENGLAND
MULLARD RES LABS,REDHILL,SURREY,ENGLAND
BERZ, F
KUIKEN, HK
论文数:
0
引用数:
0
h-index:
0
机构:
MULLARD RES LABS,REDHILL,SURREY,ENGLAND
MULLARD RES LABS,REDHILL,SURREY,ENGLAND
KUIKEN, HK
[J].
SOLID-STATE ELECTRONICS,
1976,
19
(06)
: 437
-
445
[2]
CASEY HC, 1973, J APPL PHYS, V44, P5281
[3]
APPLICATION OF SCANNING ELECTRON-MICROSCOPY TO DETERMINATION OF SURFACE RECOMBINATION VELOCITY - GAAS
JASTRZEBSKI, L
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,DEPT ELECT ENGN & COMP,CAMBRIDGE,MA 02139
JASTRZEBSKI, L
LAGOWSKI, J
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,DEPT ELECT ENGN & COMP,CAMBRIDGE,MA 02139
LAGOWSKI, J
GATOS, HC
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,DEPT ELECT ENGN & COMP,CAMBRIDGE,MA 02139
GATOS, HC
[J].
APPLIED PHYSICS LETTERS,
1975,
27
(10)
: 537
-
539
[4]
LASER BEAMS AND RESONATORS
KOGELNIK, H
论文数:
0
引用数:
0
h-index:
0
KOGELNIK, H
LI, T
论文数:
0
引用数:
0
h-index:
0
LI, T
[J].
APPLIED OPTICS,
1966,
5
(10)
: 1550
-
+
[5]
LUKE YL, 1962, INTEGRALS BESSEL FUN, P248
[6]
SEKALA AM, 1975, I PHYS C SER, P245
[7]
USE OF SCHOTTKY-DIODE COLLECTORS FOR SEM DETERMINATION OF BULK DIFFUSION LENGTHS
VANOPDORP, C
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS, EINDHOVEN, NETHERLANDS
PHILIPS RES LABS, EINDHOVEN, NETHERLANDS
VANOPDORP, C
PETERS, RC
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS, EINDHOVEN, NETHERLANDS
PHILIPS RES LABS, EINDHOVEN, NETHERLANDS
PETERS, RC
KLERK, M
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS, EINDHOVEN, NETHERLANDS
PHILIPS RES LABS, EINDHOVEN, NETHERLANDS
KLERK, M
[J].
APPLIED PHYSICS LETTERS,
1974,
24
(03)
: 125
-
126
[8]
INJECTED CURRENT CARRIER TRANSPORT IN A SEMI-INFINITE SEMICONDUCTOR AND THE DETERMINATION OF LIFETIMES AND SURFACE RECOMBINATION VELOCITIES
VANROOSBROECK, W
论文数:
0
引用数:
0
h-index:
0
VANROOSBROECK, W
[J].
JOURNAL OF APPLIED PHYSICS,
1955,
26
(04)
: 380
-
391
[9]
DETERMINATION OF MINORITY-CARRIER LIFETIME AND SURFACE RECOMBINATION VELOCITY WITH HIGH SPACIAL RESOLUTION
WATANABE, M
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,DEPT MAT SCI & ENGN,CAMBRIDGE,MA 02139
MIT,DEPT MAT SCI & ENGN,CAMBRIDGE,MA 02139
WATANABE, M
ACTOR, G
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,DEPT MAT SCI & ENGN,CAMBRIDGE,MA 02139
MIT,DEPT MAT SCI & ENGN,CAMBRIDGE,MA 02139
ACTOR, G
GATOS, HC
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,DEPT MAT SCI & ENGN,CAMBRIDGE,MA 02139
MIT,DEPT MAT SCI & ENGN,CAMBRIDGE,MA 02139
GATOS, HC
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1977,
24
(09)
: 1172
-
1177
[10]
WATSON GN, 1944, TREATISE THEORY BESS, P417
←
1
2
→