ELECTROREFLECTANCE AND RAMAN-SCATTERING INVESTIGATION OF GLOW-DISCHARGE AMORPHOUS SI-F-H

被引：45

作者：

TSU, R ^{[1
]}

IZU, M ^{[1
]}

OVSHINSKY, SR ^{[1
]}

POLLAK, FH ^{[1
]}

机构：

[1] CUNY BROOKLYN COLL, DEPT PHYS, BROOKLYN, NY 11210 USA

来源：

关键词：

D O I：

10.1016/0038-1098(80)90019-8

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：817 / 822

页数：6

共 32 条

[11] DALLING G, 1962, S INEL SCATTERING CH, V2, P37
[12] ESSER B, 1972, PHYS STATUS SOLIDI B, V51, P735
[13] SECOND INDIRECT BAND-GAP IN SILICON
FORMAN, RA
THURBER, WR
ASPNES, DE
[J]. SOLID STATE COMMUNICATIONS, 1974, 14 (10) : 1007 - 1010
[14] FREEMAN EC, UNPUBLISHED
[15] HAMAKAWA Y, 1979, OPTICAL PROPERTIES S
[16] JAN GJ, COMMUNICATION
[17] JOANNOPOULOUS JD, 1973, PHYS REV, V88, P2733
[18] SYMMETRY ANALYSIS AND UNIAXIAL-STRESS EFFECT ON LOW-FIELD ELECTROREFLECTANCE OF SI FROM 3.0 TO 4.0 EV
KONDO, K
MORITANI, A
[J]. PHYSICAL REVIEW B, 1976, 14 (04): : 1577 - 1592
[19] ELECTRONIC STRUCTURE AND OPTICAL PROPERTIES OF AMORPHOUS GERMANIUM AND SILICON
KRAMER, B
[J]. PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1971, 47 (02): : 501 - &
[20] ELECTRICAL AND OPTICAL-PROPERTIES OF AMORPHOUS SI-F-H ALLOYS
MADAN, A
OVSHINSKY, SR
BENN, E
[J]. PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1979, 40 (04): : 259 - 277