MICROMETER SCALE VISUALIZATION OF THERMAL WAVES BY PHOTOREFLECTANCE MICROSCOPY

被引：92

作者：

POTTIER, L

机构：

[1] Laboratoire d'Instrumentation E.S.P.C.I., F-75005 Paris

来源：

APPLIED PHYSICS LETTERS | 1994年 / 64卷 / 13期

关键词：

D O I：

10.1063/1.111856

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We propose a novel approach of photoreflectance microscopy that provides a direct visualization of the phase contour lines of the thermal wave. The method is applicable to (possibly heterogeneous) samples of mediocre polish. In a locally homogeneous region it yields the local thermal diffusivity.

引用

页码：1618 / 1619

页数：2

共 8 条

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