THE CRYSTAL STRUCTURE OF CECU6

[1] X-RYA INVESTIGATION OF CU-CE ALLOYS, RICH IN COPPER - WITH A DISCUSSION OF THE INTERATOMIC DISTANCES IN THE A5B STRUCTURE TYPE [J]. ACTA CHEMICA SCANDINAVICA, 1952, 6 (05): : 709 - 719

[2] USE OF A GEIGER COUNTER FOR THE MEASUREMENT OF X-RAY INTENSITIES FROM SMALL SINGLE CRYSTALS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1953, 24 (02) : 156 - 161

[3] APPARATUS FOR MEASURING COMPLETE SINGLE-CRYSTAL X-RAY DIFFRACTION DATA BY MEANS OF A GEIGER COUNTER DIFFRACTOMETER [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1955, 26 (05) : 449 - 453

[4] FURNAS TC, 1957, SINGLE CRYSTAL ORIEN

[5] Hanaman F., 1915, INT Z METALLOGR, V7, P174

[6] HANSEN M, 1958, CONSTITUTION BINARY, P450

[7] JAMES RW, 1948, OPTICAL PRINCIPLES D, P608

[8] THE ANISOTROPIC STRUCTURE REFINEMENT OF 4-METHYL-1,2-DITHIA-4-CYCLOPENTENE-3-THIONE ON AN IBM TYPE-650 COMPUTER [J]. ACTA CRYSTALLOGRAPHICA, 1959, 12 (06): : 447 - 454

[9] LIPSON H, 1953, DETERMINATION CRYSTA, P255

[10] OLSEN CE, 1959, COMMUNICATION

[1] X-RYA INVESTIGATION OF CU-CE ALLOYS, RICH IN COPPER - WITH A DISCUSSION OF THE INTERATOMIC DISTANCES IN THE A5B STRUCTURE TYPE [J]. ACTA CHEMICA SCANDINAVICA, 1952, 6 (05): : 709 - 719

[2] USE OF A GEIGER COUNTER FOR THE MEASUREMENT OF X-RAY INTENSITIES FROM SMALL SINGLE CRYSTALS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1953, 24 (02) : 156 - 161

[3] APPARATUS FOR MEASURING COMPLETE SINGLE-CRYSTAL X-RAY DIFFRACTION DATA BY MEANS OF A GEIGER COUNTER DIFFRACTOMETER [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1955, 26 (05) : 449 - 453

[4] FURNAS TC, 1957, SINGLE CRYSTAL ORIEN

[5] Hanaman F., 1915, INT Z METALLOGR, V7, P174

[6] HANSEN M, 1958, CONSTITUTION BINARY, P450

[7] JAMES RW, 1948, OPTICAL PRINCIPLES D, P608

[8] THE ANISOTROPIC STRUCTURE REFINEMENT OF 4-METHYL-1,2-DITHIA-4-CYCLOPENTENE-3-THIONE ON AN IBM TYPE-650 COMPUTER [J]. ACTA CRYSTALLOGRAPHICA, 1959, 12 (06): : 447 - 454

[9] LIPSON H, 1953, DETERMINATION CRYSTA, P255

[10] OLSEN CE, 1959, COMMUNICATION