SCANNING ULTRAHIGH VACUUM REFLECTOMETER

被引:18
作者
HUEN, T
IRANI, GB
WOOTEN, F
机构
来源
APPLIED OPTICS | 1971年 / 10卷 / 03期
关键词
D O I
10.1364/AO.10.000552
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
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页码:552 / &
相关论文
共 7 条
[1]   PRECISION MEASUREMENT OF ABSOLUTE SPECULAR REFLECTANCE WITH MINIMIZED SYSTEMATIC ERRORS [J].
BENNETT, HE ;
KOEHLER, WF .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1960, 50 (01) :1-6
[2]   THE OPTICAL PROPERTIES OF EVAPORATED GOLD IN THE VACUUM ULTRAVIOLET FROM 300 A TO 2000 A [J].
CANFIELD, LR ;
HASS, G ;
HUNTER, WR .
JOURNAL DE PHYSIQUE, 1964, 25 (1-2) :124-129
[3]   A NORMAL INCIDENCE SCANNING REFLECTOMETER OF HIGH PRECISION [J].
GERHARDT, U ;
RUBLOFF, GW .
APPLIED OPTICS, 1969, 8 (02) :305-&
[4]  
MOORE RD, 1962, ELECTRONICS, V35, P23
[5]  
MOORE RD, 1962, ELECTRONICS, V35, P40
[6]  
RUBLOFF GW, 1970, PRIVATE COMMUNICATIO
[7]  
SAMSON JAR, 1967, TECHNIQUES VACUUM UL, P34