LOW TEMPERATURE WEISSENBERG CAMERA

被引:6
作者
VISWAMITRA, MA
机构
来源
JOURNAL OF SCIENTIFIC INSTRUMENTS | 1962年 / 39卷 / 07期
关键词
D O I
10.1088/0950-7671/39/7/316
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:381 / &
相关论文
共 8 条
[1]   FURTHER TECHNIQUES IN SINGLE-CRYSTAL X-RAY DIFFRACTION STUDIES AT LOW TEMPERATURES [J].
ABRAHAMS, SC ;
COLLIN, RL ;
LIPSCOMB, WN ;
REED, TB .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1950, 21 (04) :396-397
[2]   A LOW TEMPERATURE SINGLE CRYSTAL X-RAY DIFFRACTION TECHNIQUE [J].
KAUFMAN, HS ;
FANKUCHEN, I .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1949, 20 (10) :733-734
[3]   LOW-TEMPERATURE X-RAY GONIOMETER FOR STRUCTURAL STUDIES OF CRYSTAL TRANSITIONS [J].
KEELING, R ;
FRAZER, BC ;
PEPINSKY, R .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1953, 24 (12) :1087-1095
[4]  
LONSDALE K, 1941, J SCI INSTRUM, V18, P133
[5]   AN IMPROVED DEVICE FOR X-RAY DIFFRACTION STUDIES AT LOW TEMPERATURES [J].
POST, B ;
SCHWARTZ, RS ;
FANKUCHEN, I .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1951, 22 (03) :218-219
[6]  
STEINFINK H, 1953, REV SCI INSTRUM, V24, P888
[7]   SIMPLE DEVICE FOR GROWING CRYSTALS AT LOW TEMPERATURES IN X-RAY CAMERAS [J].
VISWAMITRA, MA ;
RAMASESHAN, S .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1960, 31 (04) :456-457
[8]  
VISWAMITRA MA, 1959, P IND ACAD SCI A, V49, P326