DISLOCATIONS IN SEMICONDUCTORS AS STUDIED BY WEAK-BEAM ELECTRON-MICROSCOPY

被引:29
作者
COCKAYNE, DJH
HONS, A
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JOURNAL DE PHYSIQUE | 1979年 / 40卷
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D O I
10.1051/jphyscol:1979603
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页码:11 / 18
页数:8
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