ANDREEV-REFLECTION IN HIGHLY DOPED PB/N-INSB/PB JUNCTIONS

被引:5
作者
FISCHER, G
KECK, K
机构
[1] Physikalisches Institut, Universität Würzburg, Würzburg, D-97074, Am Hubland
来源
ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER | 1993年 / 92卷 / 02期
关键词
D O I
10.1007/BF01312175
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
We studied the carrier transport through n-InSb-films sandwiched between two superconducting lead electrodes. These n-InSb-films were about 30 nm thick, polycrystalline and very highly doped (10(21) cm-3). The V(I)- and dV/dI (V)-characteristics indicated all the properties of Andreev-reflection (subharmonic energy-gap structures (SGS) and excess current) according to the theory of Octavio et al. (OTBK-model) [1, 2]. Our measurements show the temperature dependence of these structures and also the influence of magnetic fields up to 80 mT and give a further reference to the importance of Andreev-reflection in semiconductor-coupled superconducting junctions (SSmS junctions).
引用
收藏
页码:187 / 190
页数:4
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