SCANNING TUNNELING MICROSCOPY OF PT/CO MULTILAYERS ON PT BUFFER LAYERS

被引：12

作者：

TANG, SL

CARCIA, PF

COULMAN, D

MCGHIE, AJ

机构：

来源：

APPLIED PHYSICS LETTERS | 1991年 / 59卷 / 22期

关键词：

D O I：

10.1063/1.105845

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have obtained scanning tunneling microscope (STM) images of Pt/Co multilayers sputter-deposited on Pt buffer layers, as well as images of only the Pt buffer layer. The surface structure of both the Pt/Co multilayers and the Pt layers evolved toward nanometer-scale crystallites with distinct, mostly six-sided polygonal grain boundaries with increasing Pt buffer layer thickness. Near-atomic resolution images revealed monatomic steps and flat terraces for an approximately 1000 angstrom thick Pt layer. From these images we concluded that the texture of the multilayer and the Pt buffer layer improved as the thickness of the Pt buffer layer increased. The correlation of the film structure of the Pt/Co multilayer to its magnetic coercivity is discussed.

引用

页码：2898 / 2900

页数：3