CHARGE COLLECTION AT LARGE ANGLES OF INCIDENCE

被引：17

作者：

MCNULTY, PJ ^{[1
]}

BEAUVAIS, WJ ^{[1
]}

REED, RA ^{[1
]}

ROTH, DR ^{[1
]}

STASSINOPOULOS, EG ^{[1
]}

BRUCKER, GJ ^{[1
]}

机构：

[1] NASA,GODDARD SPACE FLIGHT CTR,GREENBELT,MD 20771

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1992年 / 39卷 / 06期

关键词：

D O I：

10.1109/23.211344

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Charge collection exhibited by p-n junctions, which have at least one small dimension, deviates from the geometric assumptions commonly used in SEU testing. The amount of charge collected did not increase with the secant of the angle of incidence. The number of events under the peak in the charge collection spectrum did not decrease as the cosine of the angle of incidence. Both the position of the peak and the number of events under the peak measured at a given angle of incidence depended upon which symmetry axis of the device was chosen to be the axis of rotation.

引用

页码：1622 / 1629

页数：8

共 8 条

[1] MODELING CHARGE COLLECTION AND SINGLE EVENT UPSETS IN MICROELECTRONICS [J].