QUALITY MEASURE FOR LSI COMPONENTS

[1] CHANG HY, 1970, FAULT DIAGNOSIS DIGI

[2] GRANT EL, 1952, STATISTICAL QUALITY

[3] NONPARAMETRIC VALLEY-SEEKING TECHNIQUE FOR CLUSTER ANALYSIS [J]. IEEE TRANSACTIONS ON COMPUTERS, 1972, C 21 (02) : 171 - &

[4] COST-SIZE OPTIMA OF MONOLITHIC INTEGRATED CIRCUITS [J]. PROCEEDINGS OF THE IEEE, 1964, 52 (12) : 1537 - &

[5] A NEW LOOK AT YIELD OF INTEGRATED CIRCUITS [J]. PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1970, 58 (08): : 1290 - &

[6] LARGE SCALE INTEGRATION OF MOS COMPLEX LOGIC - A LAYOUT METHOD [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1967, SC 2 (04) : 182 - +

[1] CHANG HY, 1970, FAULT DIAGNOSIS DIGI

[2] GRANT EL, 1952, STATISTICAL QUALITY

[3] NONPARAMETRIC VALLEY-SEEKING TECHNIQUE FOR CLUSTER ANALYSIS [J]. IEEE TRANSACTIONS ON COMPUTERS, 1972, C 21 (02) : 171 - &

[4] COST-SIZE OPTIMA OF MONOLITHIC INTEGRATED CIRCUITS [J]. PROCEEDINGS OF THE IEEE, 1964, 52 (12) : 1537 - &

[5] A NEW LOOK AT YIELD OF INTEGRATED CIRCUITS [J]. PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1970, 58 (08): : 1290 - &

[6] LARGE SCALE INTEGRATION OF MOS COMPLEX LOGIC - A LAYOUT METHOD [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1967, SC 2 (04) : 182 - +