GATE-SELF-ALIGNED P-CHANNEL GERMANIUM MISFETS

被引:15
作者
JACKSON, TN [1 ]
RANSOM, CM [1 ]
DEGELORMO, JF [1 ]
机构
[1] IBM CORP,DIV GEN TECNOL,E FISHKILL FACIL,HOPEWELL JUNCTION,NY 12533
关键词
D O I
10.1109/55.119212
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have fabricated the first gate-self-aligned germanium MISFET's and have obtained record transconductance for germanium FET's. The devices fabricated are p-channel, inversion-mode, germanium MISFET's. A germanium-oxynitride gate dielectric is used and aluminum gates serve as the mask for self-aligned source and drain implants. A maximum room-temperature transconductance of 104 mS/mm was measured for a 0.6-mu-m gate length. A hole inversion channel mobility of 640 cm2/V . s was calculated using transconductance and capacitance data from long-channel devices. This large hole channel mobility suggests that germanium may be an attractive candidate for CMOS technology.
引用
收藏
页码:605 / 607
页数:3
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