CHARACTERIZATION OF COPPER IN PHOSPHORIC-ACID-ANODIZED 2024-T3 ALUMINUM BY AUGER-ELECTRON SPECTROSCOPY AND RUTHERFORD BACKSCATTERING

被引：4

作者：

SOLOMON, JS ^{[1
]}

MCDEVITT, NT ^{[1
]}

机构：

[1] USAF,MAT LAB,AERONAUT LABS,WRIGHT PATTERSON AFB,OH 45433

来源：

THIN SOLID FILMS | 1981年 / 84卷 / 02期

关键词：

D O I：

10.1016/0040-6090(81)90463-6

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：155 / 160

页数：6

共 14 条

[1] ANODIC OXIDE FILMS ON ALUMINUM [J].

DIGGLE, JW ;

DOWNIE, TC ;

GOULDING, CW .

CHEMICAL REVIEWS, 1969, 69 (03) :365-&

[2] APPLICATION OF ULTRAMICROTOMY TO ELECTRON-OPTICAL EXAMINATION OF SURFACE-FILMS ON ALUMINUM [J].

FURNEAUX, RC ;

THOMPSON, GE ;

WOOD, GC .

CORROSION SCIENCE, 1978, 18 (10) :853-&

[3] DEPTH RESOLUTION AND SURFACE-ROUGHNESS EFFECTS IN SPUTTER PROFILING OF NICR MULTILAYER SANDWICH SAMPLES USING AUGER-ELECTRON SPECTROSCOPY [J].

HOFMANN, S ;

ERLEWEIN, J ;

ZALAR, A .

THIN SOLID FILMS, 1977, 43 (03) :275-283

[4]

KELLER F, 1939, METALS ALLOYS, V10, P219

[5]

KISSIN GH, 1963, FINISHING ALUMINUM, P13

[6] MOBILITY OF METALLIC FOREIGN ATOMS DURING ANODIC-OXIDATION OF ALUMINUM [J].

MACKINTOSH, WD ;

BROWN, F ;

PLATTNER, HH .

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1974, 121 (10) :1281-1286

[7] INFLUENCE OF ION-BOMBARDMENT ON DEPTH RESOLUTION IN AUGER-ELECTRON SPECTROSCOPY ANALYSIS OF THIN GOLD-FILMS ON NICKEL [J].

MATHIEU, HJ ;

MCCLURE, DE ;

LANDOLT, D .

THIN SOLID FILMS, 1976, 38 (03) :281-294

[8]

MATHIEU HJ, 1977, 7TH P INT VAC C 3RD, P2213

[9] MORPHOLOGY AND MECHANISM OF FORMATION OF POROUS ANODIC FILMS ON ALUMINIUM [J].

OSULLIVAN, JP ;

WOOD, GC .

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1970, 317 (1531) :511-+

[10] AES AND SEM CHARACTERIZATION OF ANODIZED ALUMINUM-ALLOY ADHERENDS FOR ADHESIVE BONDING APPLICATION [J].

SOLOMON, JS ;

HANLIN, DE .

APPLIED SURFACE SCIENCE, 1980, 4 (3-4) :307-323

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