LONGITUDINAL AND TRANSVERSE STRAIN SENSITIVITY OF NICHROME FILMS

被引:18
作者
ANGADI, MA
WHITING, R
机构
[1] Thin Film Laboratory, Department of Physics, The University of the West Indies, St. Augustine, Trinidad and Tobago
来源
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 1990年 / 7卷 / 1-2期
关键词
D O I
10.1016/0921-5107(90)90020-C
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The longitudinal and transverse strain sensitivity is reported for nichrome films in the thickness range 5-60 nm. The longitudinal gauge factor is in the range 1.5-2.2 while the transverse gauge factor is in the range 0.08-0.2. On in situ annealing, the gauge factor increases by 10%-15% for all thicknesses. The films exhibit excellent temporal stability. © 1990.
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页码:L1 / L4
页数:4
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