LONGITUDINAL AND TRANSVERSE STRAIN SENSITIVITY OF NICHROME FILMS

被引：20

作者：

ANGADI, MA

WHITING, R

机构：

[1] Thin Film Laboratory, Department of Physics, The University of the West Indies, St. Augustine, Trinidad and Tobago

来源：

MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 1990年 / 7卷 / 1-2期

关键词：

D O I：

10.1016/0921-5107(90)90020-C

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The longitudinal and transverse strain sensitivity is reported for nichrome films in the thickness range 5-60 nm. The longitudinal gauge factor is in the range 1.5-2.2 while the transverse gauge factor is in the range 0.08-0.2. On in situ annealing, the gauge factor increases by 10%-15% for all thicknesses. The films exhibit excellent temporal stability. © 1990.

引用

页码：L1 / L4

页数：4

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