LONGITUDINAL AND TRANSVERSE STRAIN SENSITIVITY OF NICHROME FILMS

被引：18

作者：

ANGADI, MA

WHITING, R

机构：

[1] Thin Film Laboratory, Department of Physics, The University of the West Indies, St. Augustine, Trinidad and Tobago

来源：

MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 1990年 / 7卷 / 1-2期

关键词：

D O I：

10.1016/0921-5107(90)90020-C

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The longitudinal and transverse strain sensitivity is reported for nichrome films in the thickness range 5-60 nm. The longitudinal gauge factor is in the range 1.5-2.2 while the transverse gauge factor is in the range 0.08-0.2. On in situ annealing, the gauge factor increases by 10%-15% for all thicknesses. The films exhibit excellent temporal stability. © 1990.

引用

页码：L1 / L4

页数：4

共 14 条

[1] VACUUM-DEPOSITED FILMS OF NICKEL-CHROMIUM ALLOY [J].

ALDERSON, RH ;

ASHWORTH, F .

BRITISH JOURNAL OF APPLIED PHYSICS, 1957, 8 (05) :205-210

[2] THE ELECTROMECHANICAL PROPERTIES OF THIN MANGANESE FILMS [J].

ANGADI, MA ;

WHITING, R ;

ANGADI, R .

JOURNAL OF MATERIALS SCIENCE LETTERS, 1989, 8 (05) :555-558

[3] EFFECT OF COMPOSITION ON TEMPERATURE COEFFICIENT OF RESISTANCE OF NICR FILMS [J].

CAMPBELL, DS ;

HENDRY, B .

BRITISH JOURNAL OF APPLIED PHYSICS, 1965, 16 (11) :1719-&

[4] ELECTROMECHANICAL PROPERTIES OF THIN VO2 FILMS ON POLYIMIDE SUBSTRATES [J].

HAKIM, MO ;

BABULANAM, SM ;

GRANQVIST, CG .

THIN SOLID FILMS, 1988, 158 (02) :L49-L52

[5] ELECTRICAL RESISTANCE-STRAIN CHARACTERISTICS OF THIN EVAPORATED METAL FILMS [J].

PARKER, RL ;

KRINSKY, A .

JOURNAL OF APPLIED PHYSICS, 1963, 34 (09) :2700-&

[6] INFLUENCE OF DEPOSITION PARAMETERS ON STRAIN SENSITIVITY OF THIN GERMANIUM FILMS [J].

PLASSA, M ;

RUMIANO, G .

THIN SOLID FILMS, 1972, 12 (01) :75-&

[7] RESPONSE OF THIN-FILM STRAIN-GAUGE TO TENSILE AND COMPRESSIVE STRAINS BY A CANTILEVER TECHNIQUE [J].

RAJANNA, K ;

MOHAN, S .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1988, 105 (02) :K181-K184

[8] LONGITUDINAL AND TRANSVERSE STRAIN SENSITIVITY OF GOLD FILM [J].

RAJANNA, K ;

MOHAN, S .

JOURNAL OF MATERIALS SCIENCE LETTERS, 1987, 6 (09) :1027-1029

[9] BEHAVIOR OF BI-SB ALLOY THIN-FILMS AS STRAIN-GAUGES [J].

SAMPATH, S ;

RAMANAIAH, KV .

THIN SOLID FILMS, 1986, 137 (02) :199-205

[10]

SIDDALL G, 1961, BR J APPL PHYS, V12, P668

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